An edition of Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
(2000)
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
by Michael L. Bushnell and Vishwani D. Agrawal
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Previews available in: English
Subjects
Digital integrated circuits, Integrated circuits, Mixed signal circuits, Semiconductor storage devices, Testing, Very large scale integration, Electronic devices & materials, General Theory of Computing, Electronic Measurements, Very-Large-Scale Integration (Vlsi), Technology, Technology & Industrial Arts, Textbooks, Science/Mathematics, Electronics - Circuits - General, Engineering - Electrical & Electronic, General, Technology / Electronics / Circuits / General, Electronics - Circuits - VLSI, Integrated circuits, very large scale integration| Edition | Availability |
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1
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) (Frontiers in Electronic Testing)
November 1, 2000, Springer
Hardcover
in English
- 1st ed. 2000. Corr. 2nd printing edition
0792379918 9780792379911
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2
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
2000, Kluwer Academic, Springer
in English
0792379918 9780792379911
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Book Details
Edition Notes
Includes bibliographical references (p. [631]-670) and index.
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| February 25, 2022 | Edited by ImportBot | import existing book |
| July 31, 2019 | Edited by MARC Bot | associate edition with work OL4618093W |
| December 3, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
| December 10, 2009 | Created by WorkBot | add works page |