An edition of Secondary ion mass spectrometry (1989)

Secondary ion mass spectrometry

a practical handbook for depth profiling and bulk impurity analysis

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  • 1 Want to read
Cover of: Secondary ion mass spectrometry by Wilson, Robert G., Wilson, Robert G.
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Last edited by Open Library Bot
December 4, 2010 | History
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An edition of Secondary ion mass spectrometry (1989)

Secondary ion mass spectrometry

a practical handbook for depth profiling and bulk impurity analysis

by

  • 1 Want to read

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Wiley
Language
English

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Subjects

Secondary ion mass spectrometry
Edition Availability
Cover of: Secondary ion mass spectrometry
Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis
1989, Wiley
in English

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Book Details

Edition Notes

Includes bibliographical references.
"A Wiley-Interscience publication.

Published in
New York

Classifications

Dewey Decimal Class
543/.0873
Library of Congress
QD96.S43 W55 1989

The Physical Object

Pagination
1 v. (various pagings) :

ID Numbers

Open Library
OL2200837M
ISBN 10
0471519456
LCCN
89022460
Goodreads
654152

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History

Download catalog record: RDF / JSON
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page