An edition of Atom-probe field ion microscopy and its applications (1989)

Atom-probe field ion microscopy and its applications

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Cover of: Atom-probe field ion microscopy and its applications by Toshio Sakurai, Toshio Sakurai
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Last edited by Open Library Bot
December 4, 2010 | History
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An edition of Atom-probe field ion microscopy and its applications (1989)

Atom-probe field ion microscopy and its applications

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Publish Date
Publisher
Academic Press
Language
English
Pages
299

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Previews available in: English

Subjects

Atom-probe field ion microscopy
Edition Availability
Cover of: Atom-probe field ion microscopy and its applications
Atom-probe field ion microscopy and its applications
1989, Academic Press
in English

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Book Details

Edition Notes

Includes bibliographical references (p. 275-292) and indexes.

Published in
Boston
Series
Advances in electronics and electron physics., 20

Classifications

Dewey Decimal Class
502/.8/2
Library of Congress
QH212.A76 S25 1989

The Physical Object

Pagination
vii, 299 p. :
Number of pages
299

ID Numbers

Open Library
OL2263940M
Internet Archive
atomprobefieldio0000saku
ISBN 10
0120145820
LCCN
89147603
Goodreads
3994070

Source records

Library of Congress MARC record
Promise Item
Internet Archive item record

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History

Download catalog record: RDF / JSON
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page