An edition of Beam injection assessment of microstructures in semiconductors (2001)

Beam injection assessment of microstructures in semiconductors

BIAMS 2000 : proceedings of the 6th International Workshop on Beam Injection Assessment of Mictrostructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000

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Cover of: Beam injection assessment of microstructures in semiconductors by International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (6th 2000 Fukuoka, Japan), International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (6th 2000 Fukuoka, Japan)
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Last edited by Open Library Bot
December 5, 2010 | History
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An edition of Beam injection assessment of microstructures in semiconductors (2001)

Beam injection assessment of microstructures in semiconductors

BIAMS 2000 : proceedings of the 6th International Workshop on Beam Injection Assessment of Mictrostructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000

by

  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Scitec Publications
Language
English
Pages
441

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Subjects

Congresses, Defects, Microscopy, Semiconductors, Testing

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Edition Availability
Cover of: Beam injection assessment of microstructures in semiconductors
Beam injection assessment of microstructures in semiconductors: BIAMS 2000 : proceedings of the 6th International Workshop on Beam Injection Assessment of Mictrostructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000
2001, Scitec Publications
in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Beam Injection Assessment of Microstructures in Semiconductors
Beam Injection Assessment of Microstructures in Semiconductors: Biams 2000 (Solid State Phenomena)
July 2001, Scitec Pubns
Paperback in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Uetikon-Zuerich, Switzerland
Series
Diffusion and defect data--solid state data., Pt. B, Solid state phenomena,, v. 78-79, Diffusion and defect data., v. 78-79.
Genre
Congresses.

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
TK7871.85 .I584365 2001

The Physical Object

Pagination
xiii, 441 p. :
Number of pages
441

ID Numbers

Open Library
OL3970668M
ISBN 10
3908450616
LCCN
2001277780
OCLC/WorldCat
47095956
Goodreads
1648347

Source records

Library of Congress MARC record

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History

Download catalog record: RDF / JSON
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page