Characterization of thin films and solid surfaces using proton-induced X-ray emission

Characterization of thin films and solid surf ...
Bruce D. Sartwell, Bruce D. Sa ...
Locate

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today


Buy this book

Last edited by Open Library Bot
December 5, 2010 | History

Characterization of thin films and solid surfaces using proton-induced X-ray emission

This edition doesn't have a description yet. Can you add one?

Publish Date
Language
English
Pages
22

Buy this book

Book Details


Edition Notes

Bibliography: p. 21-22.

Published in
[Washington]
Series
Report of investigations - Bureau of Mines ;, 8455, Report of investigations (United States. Bureau of Mines) ;, 8455.

Classifications

Dewey Decimal Class
622 s, 530.4/1
Library of Congress
TN23 .U43 no. 8455, QC176.84.R3 .U43 no. 8455

The Physical Object

Pagination
22 p. :
Number of pages
22

ID Numbers

Open Library
OL4066888M
LCCN
79607938

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page