Characterization of thin films and solid surfaces using proton-induced X-ray emission

Characterization of thin films and solid surf ...
Bruce D. Sartwell, Bruce D. Sa ...
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Last edited by Open Library Bot
December 5, 2010 | History

Characterization of thin films and solid surfaces using proton-induced X-ray emission

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Publish Date
Language
English
Pages
22

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Edition Availability
Cover of: Characterization of thin films and solid surfaces using proton-induced X-ray emission
Characterization of thin films and solid surfaces using proton-induced X-ray emission
1980, U.S. Dept. of the Interior, Bureau of Mines
in English

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Book Details


Edition Notes

Bibliography: p. 21-22.

Published in
[Washington]
Series
Report of investigations - Bureau of Mines ;, 8455, Report of investigations (United States. Bureau of Mines) ;, 8455.

Classifications

Dewey Decimal Class
622 s, 530.4/1
Library of Congress
TN23 .U43 no. 8455, QC176.84.R3 .U43 no. 8455

The Physical Object

Pagination
22 p. :
Number of pages
22

ID Numbers

Open Library
OL4066888M
LCCN
79607938

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History

Download catalog record: RDF / JSON
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page