An edition of 2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan (2006)

2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan

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2006 IEEE International Workshop on Memory Te ...
IEEE Computer Society
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Last edited by MARC Bot
December 14, 2020 | History
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An edition of 2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan (2006)

2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan

Proceedings

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
IEEE Computer Society Press
Language
English
Pages
83

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Subjects
Semiconductor storage devices, Congresses, Testing, Random access memory

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Edition Availability
Cover of: 2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan
2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan: Proceedings
January 2006, IEEE Computer Society Press
Paperback in English
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Book Details

Classifications

Library of Congress
TK7895.M4 I334 2006

The Physical Object

Format
Paperback
Number of pages
83

ID Numbers

Open Library
OL10967258M
ISBN 10
0769525725
ISBN 13
9780769525723
LCCN
2006285152

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Library of Congress MARC record

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December 14, 2020 Edited by MARC Bot import existing book
December 10, 2009 Created by WorkBot add works page