Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford

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Last edited by MARC Bot
July 23, 2024 | History

Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford

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Publish Date
Language
English
Pages
304

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Previews available in: English

Edition Availability
Cover of: Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT  Workshop on Designing for Yield, 1-3 July 1987, Oxford

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Book Details


Classifications

Library of Congress
TK7874.I475 1987, TK7874 .I475 1987

The Physical Object

Format
Hardcover
Number of pages
304

ID Numbers

Open Library
OL11603638M
Internet Archive
yieldmodellingde0000inte
ISBN 10
085274398X
ISBN 13
9780852743980
LCCN
88014068
OCLC/WorldCat
17916834

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History

Download catalog record: RDF / JSON
July 23, 2024 Edited by MARC Bot import existing book
September 17, 2021 Edited by ImportBot import existing book
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page