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Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford
January 1, 1988, Taylor & Francis, Adam Hilger
Hardcover
in English
085274398X 9780852743980
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Feedback?July 23, 2024 | Edited by MARC Bot | import existing book |
September 17, 2021 | Edited by ImportBot | import existing book |
April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
December 10, 2009 | Created by WorkBot | add works page |