An edition of Parallel test pattern generation for programmable logic devices (1995)

Parallel test pattern generation for programmable logic devices

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Parallel test pattern generation for programm ...
David Kelly
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Last edited by WorkBot
March 16, 2010 | History
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An edition of Parallel test pattern generation for programmable logic devices (1995)

Parallel test pattern generation for programmable logic devices

by

  • 0 Ratings
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  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
University College Dublin
Language
English
Pages
121

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Subjects
Programmable logic devices, Digital integrated circuits
Edition Availability
Cover of: Parallel test pattern generation for programmable logic devices
Parallel test pattern generation for programmable logic devices
1995, University College Dublin
in English
  • Not in Library

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Book Details

Edition Notes

Thesis submitted to the Department of Computer Science.

Thesis (M.Sc.) - University College Dublin, 1995.

Published in
Dublin

The Physical Object

Pagination
vii, 121p. :
Number of pages
121

ID Numbers

Open Library
OL16564165M

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March 16, 2010 Edited by WorkBot update details
December 10, 2009 Created by WorkBot add works page