An edition of Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium (2002)

Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium

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Cover of: Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium by IEEE Electron Devices Society, IEEE Electron Devices Society
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Last edited by Open Library Bot
April 28, 2010 | History
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An edition of Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium (2002)

Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium

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Publish Date
Publisher
Ieee
Language
English
Pages
210

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Edition Availability
Cover of: Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium
Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium
April 2002, Ieee
Hardcover in English - Cdr edition
Libraries near you: WorldCat
Cover of: Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium
Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium
March 2002, Ieee
Paperback in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

The Physical Object

Format
Paperback
Number of pages
210

ID Numbers

Open Library
OL11000293M
ISBN 10
0780373278
ISBN 13
9780780373273

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History

Download catalog record: RDF / JSON
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page