An edition of 2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan (2005)

2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan

Proceedings.

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Last edited by MARC Bot
December 14, 2020 | History
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An edition of 2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan (2005)

2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan

Proceedings.

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Institute of Electrical & Electronics Enginee
Language
English
Pages
153

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Subjects
Semiconductor storage devices, Congresses, Testing, Random access memory

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Edition Availability
Cover of: 2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan
2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan: Proceedings.
January 2005, Institute of Electrical & Electronics Enginee
Hardcover in English
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Book Details

Classifications

Library of Congress
TK7895.M4 I334 2005

The Physical Object

Format
Hardcover
Number of pages
153

ID Numbers

Open Library
OL10967136M
ISBN 10
0769523137
ISBN 13
9780769523132
LCCN
2006278060

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Library of Congress MARC record

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December 14, 2020 Edited by MARC Bot import existing book
December 11, 2009 Created by WorkBot add works page