An edition of Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III (1996)

Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III

16-17 October 1996, Austin, Texas

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Cover of: Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III by Damon Debusk
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Last edited by MARC Bot
November 24, 2020 | History
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An edition of Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III (1996)

Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III

16-17 October 1996, Austin, Texas

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE-International Society for Optical Engine
Language
English
Pages
218

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Subjects
Semiconductors, Testing, Manufacturing processes, Design and construction, Optical methods, Congresses, Optical detectors, Integrated circuits industry, Integrated circuits

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Edition Availability
Cover of: Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III
Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III: 16-17 October 1996, Austin, Texas
January 1996, SPIE-International Society for Optical Engine
Hardcover in English
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Book Details

Classifications

Library of Congress
TK7836 .O69 1999

The Physical Object

Format
Hardcover
Number of pages
218

ID Numbers

Open Library
OL11393012M
ISBN 10
0819422754
ISBN 13
9780819422750
LCCN
96069472

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November 24, 2020 Edited by MARC Bot import existing book
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 11, 2009 Created by WorkBot add works page