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Last edited by RenameBot
September 1, 2008 | History
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Judson C. French

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  • Cover of: New technology challenges metrology: presented at the Interamerican Metrology Conference, marking the formal establishment of the Interamerican Metrology System, held in Buenos Aires, September 4-7, 1979

    First published in 1981 — 2 editions
    Not in Library

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  • Cover of: The NIST Electronics and Electrical Engineering Laboratory and the development of its semiconductor program: a presentation to the Standards Alumni Association

    First published in 1999 — 1 edition
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Subjects

Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology), Measurement, Mensuration, Semiconductors, Technological innovations, Testing

Places

United States

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ID Numbers

  • OLID: OL1596313A

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History

Download catalog record: RDF / JSON
September 1, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import