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Last edited anonymously
April 1, 2008 | History
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Kern, Werner

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Born 1925

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  • Cover of: Techniques for measuring the integrity of passivation overcoats on integrated circuits

    First published in 1977 — 1 edition
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  • Cover of: Handbook of silicon wafer cleaning technology

    First published in 2008 — 1 edition
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  • Cover of: Thin film processes

    First published in 1978 — 1 edition
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We need a photo of Kern, Werner

Born 1925

Subjects

Electric insulators and insulation, Electronics, Integrated circuits, Microelectronics, Passivation, Protective coatings, Quality control, Semiconductors, Silicium sur isolant, Silicon-on-insulator technology, Solid State, TECHNOLOGY & ENGINEERING, Testing, Thin films

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ID Numbers

  • OLID: OL1949010A

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History

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April 1, 2008 Created by an anonymous user initial import