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Subjects
Electrons, Diffraction, Electron microscopes, Electron microscopy, Metals, Physical metallurgy, Congresses, Crystallography, Defects, Electrons, diffraction, Fatigue, Fracture mechanics, Materials, Metallography, Metals, defects, Nondestructive testing, Physics, Solid state physics, Structural analysis (Engineering), Structural analysis (engineering)People
M. J. WhelanID Numbers
- OLID: OL2007668A
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August 22, 2008 | Edited by RenameBot | fix author name |
April 1, 2008 | Created by an anonymous user | initial import |