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Surface scattering and diffraction for advanced metrology II: 9 July, 2002, Seattle, Washington, USA
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Subjects
Congresses, Measurement, Surface roughness, Surfaces (technology), Light, Light, scattering, Nanostructured materials, Scattering, Scattering (Physics), Contamination, Dielectrics, Diffraction, Diffractive scattering, Electromagnetic waves, Materials, Metrology, Nanostructures, Optical measurements, Optics, Phonons, Photonics, Photons, Scattering (physics), Space vehicles, Surface contaminationID Numbers
- OLID: OL2680261A
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April 29, 2008 | Created by an anonymous user | initial import |