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Last edited anonymously
April 29, 2008 | History
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Enrique del Castillo

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5 works Add another?

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  • Cover of: Run-To-Run Control in Semiconductor Manufacturing

    First published in 2010 — 5 editions
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  • Cover of: Bayesian Process Monitoring, Control and Optimization

    First published in 2006 — 3 editions
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  • Cover of: Process Optimization: A Statistical Approach (International Series in Operations Research & Management Science)

    First published in 2007 — 3 editions
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  • Cover of: Statistical Process Adjustment for Quality Control

    First published in 2002 — 1 edition
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  • Cover of: Process Optimization A Statistical Approach

    First published in 2010 — 1 edition
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We need a photo of Enrique del Castillo

Subjects

Mathematical optimization, Process control, Statistical methods, Contrôle, Distribution (Probability theory), Electronic packaging, Engineering, Engineering design, Fabrication, Industrial engineering, Méthodes statistiques, Optimaliseren, Optimisation mathématique, Production engineering, Production management, Quality control, Semiconductor industry, Semiconductors, Statistics, System safety

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ID Numbers

  • OLID: OL2682864A

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History

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April 29, 2008 Created by an anonymous user initial import