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Last edited anonymously
April 30, 2008 | History
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David G. Seiler

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9 works Add another?

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  • Cover of: Metrology and Diagnostic Techniques for Nanoelectronics

    First published in 2016 — 4 editions
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  • Cover of: Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)

    First published in 2000 — 3 editions
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  • Cover of: Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449)

    First published in 1998 — 2 editions
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  • Cover of: The Spectroscopy of Semiconductors: Volume 36 (Semiconductors and Semimetals, 36)

    First published in 1992 — 2 editions
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  • Cover of: Spectroscopy of Semiconductors

    First published in 1992 — 1 edition
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  • Cover of: Life on Hold: Finding Hope in the Face of Serious Illness

    First published in 2006 — 1 edition
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  • Cover of: Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites

    First published in 1994 — 1 edition
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  • Cover of: Semiconductor Characterization: Present Status and Future Needs

    First published in 1996 — 1 edition
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  • Cover of: Narrow-gap semiconductors and related materials

    First published in 1990 — 1 edition
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We need a photo of David G. Seiler

Subjects

Congresses, Semiconductors, Integrated circuits, Software, Ultra large scale integration, Characterization, Design and construction, Electronics, GOES (Meteorological satellite), Infrared detectors, Mechanical, Metrology, Nanoelectronics, Narrow gap semiconductors, Optical equipment, Space vehicles, TECHNOLOGY & ENGINEERING, TIROS satellites, Terminally ill, family relationships

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ID Numbers

  • OLID: OL3116166A

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History

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April 30, 2008 Created by an anonymous user initial import