An edition of Characterization and metrology for ULSI technology
(1998)
Characterization and Metrology for Ulsi Technology
1998 International Conference (AIP Conference Proceedings, Vol. 449)
1 edition
by David G. Seiler
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| Edition | Availability |
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1
Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449)
December 14, 1998, American Institute of Physics
Hardcover
in English
- 1 edition
1563967537 9781563967535
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2
Characterization and metrology for ULSI technology: 1998 international conference, Gaithersburg, Maryland, March 1998
1998, American Institute of Physics
in English
1563967537 9781563967535
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- Created April 30, 2008
- 4 revisions
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| July 31, 2019 | Edited by MARC Bot | associate edition with work OL19424797W |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |