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Last edited anonymously
April 30, 2008 | History
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Kevin M. Monahan

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6 works Add another?

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  • Cover of: Integrated circuit metrology, inspection, and process control II: 29 February-1 March 1988, Santa Clara, California

    First published in 1988 — 3 editions
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  • Cover of: Integrated circuit metrology, inspection, and process control III: 27-28 February 1989, Los Angeles, California

    First published in 1989 — 2 editions
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  • Cover of: Integrated circuit metrology, inspection, and process control: [papers]

    First published in 1987 — 2 editions
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  • Cover of: Cost and performance in integrated circuit creation: 27-28 February 2003, Santa Clara, California, USA

    First published in 2003 — 1 edition
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  • Cover of: Handbook of critical dimension metrology and process control

    First published in 1994 — 1 edition
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  • Cover of: Micron and submicron integrated circuit metrology: August 22-23, 1985, San Diego, California

    First published in 1985 — 1 edition
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Subjects

Congresses, Integrated circuits, Measurement, Design and construction, Inspection, Process control, Quality control, Semiconductors, Analysis, Costs, Defects, Electronic industries, Engineering inspection, Microelectronics industry, Optical methods, Production control, Semiconductor wafers, Testing, Weights and measures

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ID Numbers

  • OLID: OL3307435A

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History

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April 30, 2008 Created by an anonymous user initial import