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Last edited by RenameBot
September 2, 2008 | History
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Sreejit Chakravarty

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4 works Add another?

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  • Cover of: An approach to designing stuck-open testable CMOS combinational circuit

    First published in 1990 — 1 edition
    Not in Library

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  • Cover of: Introduction to ID̳D̳Q̳ testing

    First published in 1997 — 1 edition
    Not in Library

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  • Cover of: Using path parity for "collapsing" stuck-open fault-lists and designing stuck-open testable circuits

    First published in 1990 — 1 edition
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  • Cover of: Introduction to IDDQ Testing

    First published in 1997 — 1 edition
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Subjects

Testing, Electronic circuits, Computer engineering, Computer-aided design, Digital integrated circuits, Engineering, Iddq testing, Integrated circuits, Integrated circuits, very large scale integration, Very large scale integration

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ID Numbers

  • OLID: OL388956A

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History

Download catalog record: RDF / JSON
September 2, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import