An edition of An approach to designing stuck-open testable CMOS combinational circuit (1990)

An approach to designing stuck-open testable CMOS combinational circuit

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An approach to designing stuck-open testable ...
Sreejit Chakravarty, Sreejit C ...
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Last edited by VacuumBot
August 5, 2012 | History
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An edition of An approach to designing stuck-open testable CMOS combinational circuit (1990)

An approach to designing stuck-open testable CMOS combinational circuit

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Publish Date
Publisher
State University of New York at Buffalo, Dept. of Computer Science
Language
English
Pages
29

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Subjects

Electronic circuits, Testing
Edition Availability
Cover of: An approach to designing stuck-open testable CMOS combinational circuit
An approach to designing stuck-open testable CMOS combinational circuit
1990, State University of New York at Buffalo, Dept. of Computer Science
Microform in English

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Book Details

Edition Notes

"February 1990."

Includes bibliographical references.

Checklist of official publications of the State of New York, 1990.

Microfiche. Albany, N.Y. : New York State Library, filmed by AMTEK Corporation, 1994. 1 microfiche.

Published in
Buffalo, N.Y
Series
Technical report (State University of New York at Buffalo. Dept. of Computer Science) -- 90-01

The Physical Object

Format
Microform
Pagination
29 p.
Number of pages
29

Edition Identifiers

Open Library
OL22269710M

Work Identifiers

Work ID
OL2666667W

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
August 5, 2012 Edited by VacuumBot Updated format '[microform] /' to 'Microform'; cleaned up pagination
December 15, 2009 Edited by WorkBot link works
November 9, 2008 Created by ImportBot Imported from Binghamton University MARC record