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Last edited by ImportBot
December 4, 2010 | History
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Zu-Han Gu

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  • Cover of: Surface scattering and diffraction for advanced metrology: 1 August 2001, San Diego, USA

    First published in 2001 — 1 edition
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  • Cover of: Surface scattering and diffraction for advanced metrology II: 9 July, 2002, Seattle, Washington, USA

    First published in 2002 — 1 edition
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  • Cover of: Surface scattering and diffraction III: 4-6 August, 2003, San Diego, California, USA

    First published in 2003 — 1 edition
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  • Cover of: Scattering and surface roughness III: 1-2 August 2000, San Diego, USA

    First published in 2000 — 1 edition
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  • Cover of: Rough Surface Scattering and Contamination: 21-23 July 1999, Denver, Colorado (Proceedings of Spie--the International Society for Optical Engineering, V. 3784.)

    First published in 1999 — 1 edition
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  • Cover of: Scattering and surface roughness II: 21-23 July 1998, San Diego, California

    First published in 1998 — 1 edition
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We need a photo of Zu-Han Gu

Subjects

Congresses, Measurement, Surface roughness, Scattering (Physics), Diffractive scattering, Light, Metrology, Optical measurements, Scattering, Scattering (physics), Electromagnetic waves, Contamination, Light, scattering, Optics, Space vehicles, Surface chemistry, Surface contamination, Surfaces (physics), Weights and measures

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ID Numbers

  • OLID: OL6864712A

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History

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December 4, 2010 Created by ImportBot new author