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Last edited by ImportBot
November 19, 2019 | History
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Haifei Bao

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  • Cover of: Measurement Technology for Micro-Nanometer Devices

    First published in 2016 — 5 editions
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Subjects

Measurement, Microelectromechanical devices, Microelectromechanical systems, Microscopy, technique, Microtechnology, Nanotechnology, Physical measurements, Testing

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ID Numbers

  • OLID: OL7761130A

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History

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November 19, 2019 Created by ImportBot import new book