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Last edited by ImportBot
August 15, 2020 | History
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Gudrun Kissinger

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  • Cover of: Silicon, Germanium, and Their Alloys: Growth, Defects, Impurities, and Nanocrystals

    First published in 2014 — 4 editions
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  • Cover of: In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II: 31 May-1 June 2001, Edinburgh, UK

    First published in 2001 — 1 edition
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  • Cover of: In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing: 19-21 May, 1999, Edinburgh, Scotland

    First published in 1999 — 1 edition
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Subjects

Congresses, Design and construction, Integrated circuits, Manufacturing processes, Materials, Microelectronics, Semiconductors, Very large scale integration, Alliages, Alloys, Chemical & Biochemical, Chemistry, Germanium, Germanium alloys, Industrial & Technical, SCIENCE, Silicium, Silicon, Silicon alloys, TECHNOLOGY & ENGINEERING

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ID Numbers

  • OLID: OL8137359A

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History

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August 15, 2020 Created by ImportBot import new book