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Previews available in: English
Subjects
Very large scale integration, Testing, Design, Integrated circuits, Systems on a chip, Electrical engineering, Technology & Engineering, Computers - General Information, Science/Mathematics, Electricity, Logic Design, Computers & Internet, Technology / Engineering / Electrical, Engineering - Electrical & Electronic, Design, Integrated circuits, Systems on a chip, Testing, Very large scale integration, Integrated circuits, very large scale integrationShowing 3 featured editions. View all 3 editions?
Edition | Availability |
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1
System-On-Chip Test Architectures: Nanometer Design for Testability
2010, Elsevier Science & Technology Books
in English
0080556809 9780080556802
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2
System-on-chip test architectures: nanometer design for testability
2008, Morgan Kaufmann Publishers
in English
012373973X 9780123739735
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WorldCat
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3
System-on-Chip Test Architectures (Systems on Silicon)
November 16, 2007, Morgan Kaufmann
Hardcover
in English
012373973X 9780123739735
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aaaa
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WorldCat
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- Created April 30, 2008
- 10 revisions
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January 1, 2023 | Edited by MARC Bot | import existing book |
December 17, 2020 | Edited by MARC Bot | import existing book |
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August 1, 2020 | Edited by ImportBot | import existing book |
April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |