An edition of Materials Reliability Issues in Microelectronics (1991)

Materials Reliability Issues in Microelectronics (Materials Research Society Symposium Proceedings)

by , , , and

Cover of: Materials Reliability Issues in Microelectronics (Materials Research Society Symposium Proceedings) by J. R. Llyod, P. S. Ho, C. T. Fah, E. Yost, J. R. Llyod, P. S. Ho, C. T. Fah, E. Yost
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Last edited by MARC Bot
July 21, 2024 | History
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An edition of Materials Reliability Issues in Microelectronics (1991)

Materials Reliability Issues in Microelectronics (Materials Research Society Symposium Proceedings)

by , , , and

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Publish Date
Publisher
Materials Research Society
Language
English
Pages
354

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Subjects

Materials, research, Microelectronics, Reliability, Congresses, Materials, Testing, Electrodiffusion, Microstructure

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Edition Availability
Cover of: Materials Reliability Issues in Microelectronics (Materials Research Society Symposium Proceedings)
Materials Reliability Issues in Microelectronics (Materials Research Society Symposium Proceedings)
November 1991, Materials Research Society
Hardcover in English
  • Not in Library
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Book Details

Classifications

Library of Congress
, TK7874 .M3443 1991

The Physical Object

Format
Hardcover
Number of pages
354
Dimensions
9.2 x 6.2 x 1 inches
Weight
1.5 pounds

ID Numbers

Open Library
OL12091872M
ISBN 10
1558991190
ISBN 13
9781558991194
LCCN
91030404
OCLC/WorldCat
24429846
Goodreads
4830404

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 21, 2024 Edited by MARC Bot import existing book
December 10, 2023 Edited by ImportBot import existing book
October 7, 2020 Edited by ImportBot import existing book
July 31, 2020 Edited by ImportBot import existing book
April 30, 2008 Created by an anonymous user Imported from amazon.com record