An edition of Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems (1992)

Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

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Antireflecting-Chromium linewidth standard, S ...
Carol F. Vezzetti
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Last edited by MARC Bot
November 16, 2020 | History
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An edition of Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems (1992)

Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Language
English
Pages
37

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Subjects
Calibration, Integrated circuits, Microscopes, Microscopy, Optical measurements, Standards, Chromium, Spectra

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Edition Availability
Cover of: Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
in English
  • Not in Library
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English

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Book Details

Edition Notes

PRIORITY 2.

Published in
Gaithersburg, Md
Series
Standard reference materials, NIST Publication ;, 260-117

Classifications

Library of Congress
IN PROCESS, QC100 .U57 no. 260-117, QH211 .U57 no. 260-117

The Physical Object

Pagination
37 p. ;
Number of pages
37

ID Numbers

Open Library
OL1357810M
LCCN
92250905

Source records

Library of Congress MARC record

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
November 16, 2020 Edited by MARC Bot import existing book
December 11, 2009 Edited by WorkBot link works
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record