Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

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Antireflecting-chromium linewidth standard, S ...
Carol F. Vezzetti, Carol F. Ve ...
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Last edited by VacuumBot
August 8, 2012 | History

Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

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Edition Availability
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
in English

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Book Details


Edition Notes

Distributed to depository libraries in microfiche.

Shipping list no.: 92-2096-M.

Paper version no longer for sale by the Supt. of Docs.

"Issued January 1992."

Includes bibliographical references.

Final.

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.

Published in
Gaithersburg, MD, [Springfield, VA
Series
Standard reference materials, NIST special publication -- 260-117.
Other Titles
Antireflecting chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems.

The Physical Object

Format
Microform
Pagination
xi, 37 p.
Number of pages
37

ID Numbers

Open Library
OL18059817M

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
August 8, 2012 Edited by VacuumBot Updated format '[microform] /' to 'Microform'; cleaned up pagination
December 15, 2009 Edited by WorkBot link works
October 9, 2008 Created by ImportBot Imported from Oregon Libraries MARC record