An edition of MEMS length and strain measurements using an optical interferometer
(2001)
MEMS length and strain measurements using an optical interferometer
by J. C. Marshall
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Publish Date
2001
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Language
English
Pages
81
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| Edition | Availability |
|---|---|
1
MEMS length and strain measurements using an optical interferometer
2001, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
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aaaa
|
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2
MEMS length and strain measurements using an optical interferometer
2001, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
|
3
MEMS length and strain measurements using an optical interferometer
2001, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
|
zzzz
|
Book Details
Edition Notes
"August 2, 2001."
Shipping list no.: 2002-0384-M
Includes bibliographical references (p. 42-44)
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002 1 microfiche : negative
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History
- Created August 29, 2008
- 4 revisions
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| August 4, 2012 | Edited by VacuumBot | Updated format '[microform] /' to 'Microform'; cleaned up pagination |
| December 15, 2009 | Edited by WorkBot | link works |
| April 27, 2009 | Edited by ImportBot | add OCLC number |
| August 29, 2008 | Created by ImportBot | Imported from Western Washington University MARC record |