An edition of Microelectronic test pattern NBS-4
(1978)
Microelectronic test pattern NBS-4
by W. Robert Thurber
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Subjects
Equipment and supplies, Microelectronics, Semiconductors, Silicones, Testing, SiliconShowing 2 featured editions. View all 2 editions?
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1
Microelectronic test pattern NBS-4
1978, Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English
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2
Microelectronic test pattern NBS-4
1978, U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English
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Book Details
Edition Notes
Activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards
Prepared by Electronic Technology Division Institute for Applied Technology
Issued April 1978
Includes bibliographical references
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History
- Created September 15, 2008
- 3 revisions
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| November 15, 2023 | Edited by MARC Bot | import existing book |
| December 15, 2009 | Edited by WorkBot | link works |
| September 15, 2008 | Created by ImportBot | Imported from Miami University of Ohio MARC record |