An edition of Microelectronic test pattern NBS-4 (1978)

Microelectronic test pattern NBS-4

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Microelectronic test pattern NBS-4
W. Robert Thurber
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Last edited by MARC Bot
October 16, 2020 | History
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An edition of Microelectronic test pattern NBS-4 (1978)

Microelectronic test pattern NBS-4

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Publish Date
Publisher
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Language
English
Pages
83

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Subjects
Equipment and supplies, Microelectronics, Semiconductors, Silicones, Testing, Silicon

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Edition Availability
Cover of: Microelectronic test pattern NBS-4
Microelectronic test pattern NBS-4
1978, U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English
  • Not in Library
Cover of: Microelectronic test pattern NBS-4
Microelectronic test pattern NBS-4
1978, Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references.
"This activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards."

Published in
Washington
Series
Semiconductor measurement technology, NBS special publication ; 400-32, NBS special publication ;, 400-32.

Classifications

Dewey Decimal Class
602/.1 s, 621.381/73
Library of Congress
QC100 .U57 no. 400-32, TK7871.85 .U57 no. 400-32

The Physical Object

Pagination
vi, 83 p. :
Number of pages
83

ID Numbers

Open Library
OL4376164M
LCCN
78606024

Source records

Library of Congress MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
October 16, 2020 Edited by MARC Bot import existing book
December 14, 2009 Edited by WorkBot link works
December 14, 2009 Edited by WorkBot link works
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record