Secondary ion mass spectrometry, SIMS X

proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995

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Last edited by OCLC Bot
April 30, 2011 | History

Secondary ion mass spectrometry, SIMS X

proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995

  • 0 Ratings
  • 0 Want to read
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Publish Date
Publisher
Wiley
Language
English
Pages
1057

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Edition Availability
Cover of: Secondary ion mass spectrometry, SIMS X
Cover of: Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry: SIMS X
May 1997, John Wiley & Sons Ltd (Import)
Paperback in English

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Book Details


Edition Notes

Published in
Chichester
Other Titles
SIMS X, Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X)

Classifications

Dewey Decimal Class
543.0873
Library of Congress
QD96.S43 I58 1995

The Physical Object

Pagination
xxv, 1057 p. :
Number of pages
1057

ID Numbers

Open Library
OL20311974M
ISBN 10
0471958972
OCLC/WorldCat
36720512
Goodreads
4354840

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
April 30, 2011 Edited by OCLC Bot Added OCLC numbers.
April 16, 2010 Edited by bgimpertBot Added goodreads ID.
December 15, 2009 Edited by WorkBot link works
October 26, 2008 Created by ImportBot Imported from University of Toronto MARC record