An edition of Microscopy of semiconducting materials 2003 (2003)

Microscopy of semiconducting materials 2003

proceedings of the Institute of Physics Conference : Cambridge University, 31 March-3 April, 2003

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Microscopy of semiconducting materials 2003
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Last edited by bgimpertBot
April 16, 2010 | History
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An edition of Microscopy of semiconducting materials 2003 (2003)

Microscopy of semiconducting materials 2003

proceedings of the Institute of Physics Conference : Cambridge University, 31 March-3 April, 2003

by

  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Institute of Physics Pub.
Language
English
Pages
686

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Subjects

Congresses, Surfaces, Materials, Epitaxy, Semiconductors, High resolution electron microscopy, Microscopy

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Cover of: Microscopy of semiconducting materials 2003
Microscopy of semiconducting materials 2003: proceedings of the Institute of Physics Conference : Cambridge University, 31 March-3 April, 2003
2003, Institute of Physics Pub.
in English
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Book Details

Edition Notes

"MSM XIII."

"This volume contains the invited and contributed papers presented at the conference on "Microscopy of Semiconducting Materials' held at the University of Cambridge on 32 March-3 April 2003 ... organised ... by the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society, and the Materials Research Society"--Pref.

Includes bibliographical references and indexes.

Published in
Bristol, Philadelphia
Series
Institute of Physics conference series -- no. 180
Genre
Congresses.
Other Titles
MSM XIII

Classifications

Library of Congress
QC610.9 .M536 2003

The Physical Object

Pagination
xviii, 686 p. :
Number of pages
686

ID Numbers

Open Library
OL22596566M
ISBN 10
0750309792
Goodreads
4190382

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
April 16, 2010 Edited by bgimpertBot Added goodreads ID.
December 15, 2009 Edited by WorkBot link works
November 16, 2008 Created by ImportBot Imported from University of Toronto MARC record