An edition of Advanced characterization techniques for optics, semiconductors, and nanotechnologies III (2007)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III

28-29 August 2007, San Diego, California, USA

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Advanced characterization techniques for opti ...
Angela Duparré, Angela Duparré
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Last edited by MARC Bot
May 28, 2023 | History
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An edition of Advanced characterization techniques for optics, semiconductors, and nanotechnologies III (2007)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III

28-29 August 2007, San Diego, California, USA

by

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Publish Date
Publisher
SPIE
Language
English

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Subjects

Optical properties, Characterization, Semiconductors, Optoelectronics, Thin films, Optoelectronic devices, Congresses, Optical measurements, Nanotechnology, Interferometry
Edition Availability
Cover of: Advanced characterization techniques for optics, semiconductors, and nanotechnologies III
Advanced characterization techniques for optics, semiconductors, and nanotechnologies III: 28-29 August 2007, San Diego, California, USA
2007, SPIE
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE -- v. 6672, Proceedings of SPIE--the International Society for Optical Engineering -- v. 6672.

Classifications

Library of Congress
TA1750 .A333 2007,

The Physical Object

Pagination
1 v. (various pagings) :

ID Numbers

Open Library
OL25085345M
ISBN 10
0819468207
ISBN 13
9780819468208
LCCN
2010287972
OCLC/WorldCat
174117963

Source records

Library of Congress MARC record
Library of Congress MARC record
Better World Books record
harvard_bibliographic_metadata record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
May 28, 2023 Edited by MARC Bot import existing book
September 10, 2021 Edited by ImportBot import existing book
November 14, 2020 Edited by MARC Bot import existing book
November 4, 2011 Created by LC Bot Imported from Library of Congress MARC record