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Previews available in: English
Subjects
Physical organic chemistry, Materials, Microreactors, Ceramic materials, Semiconductors, Scanning electron microscopes, Chemistry, Microengineering, Atomic/Molecular Structure and Spectra, Building materials, Physical and theoretical Chemistry, Spectroscopy and Microscopy, Ceramics, Glass, Composites, Natural Methods, Materials scienceShowing 2 featured editions. View all 2 editions?
Edition | Availability |
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1
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
May 28, 2013, Springer
paperback
1461428572 9781461428572
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2
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
2011, Springer Science+Business Media, LLC
electronic resource /
in English
144197816X 9781441978165
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- Created July 28, 2014
- 6 revisions
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August 15, 2024 | Edited by MARC Bot | import existing book |
February 26, 2022 | Edited by ImportBot | import existing book |
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August 2, 2020 | Edited by ImportBot | import existing book |
July 28, 2014 | Created by ImportBot | Imported from Internet Archive item record |