An edition of Hot-Carrier Reliability of MOS VLSI Circuits (1993)

Hot-Carrier Reliability of MOS VLSI Circuits

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Cover of: Hot-Carrier Reliability of MOS VLSI Circuits by Yusuf Leblebici
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Last edited by ImportBot
February 27, 2022 | History
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An edition of Hot-Carrier Reliability of MOS VLSI Circuits (1993)

Hot-Carrier Reliability of MOS VLSI Circuits

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

This volume addresses the issues related to hot-carrier reliability of MOS VLSI circuits, ranging from device physics to circuit design guidelines. It presents a unified view of the physical mechanisms involved in hot-carrier induced device degradation, the prevalent models for these mechanisms, and simulation methods for estimating hot-carrier effects in the circuit environment. The newly emerging approaches to the VLSI design-for-reliability and rule-based reliability diagnosis are also discussed in detail. Hot-Carrier Reliability of MOS VLSI Circuits is primarily for use by engineers and scientists who study device and circuit-level reliability in VLSI systems and develop practical reliability measures and models. VLSI designers will benefit from this book since it offers a comprehensive overview of the interacting mechanisms that influence hot-carrier reliability, and also provides useful guidelines for reliable VLSI design. This volume can be used as an advanced textbook or reference for a graduate-level course on VLSI reliability.

Publish Date
Publisher
Springer US
Language
English
Pages
212

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Previews available in: English

Subjects
Systems engineering, Engineering, Computer engineering

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Edition Availability
Cover of: Hot-Carrier Reliability of MOS VLSI Circuits
Hot-Carrier Reliability of MOS VLSI Circuits
1993, Springer US
electronic resource / in English
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Book Details

Edition Notes

Online full text is restricted to subscribers.

Also available in print.

Mode of access: World Wide Web.

Published in
Boston, MA
Series
The Springer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 227, Springer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 227.

Classifications

Dewey Decimal Class
621.3815
Library of Congress
TK7888.4, TK7888.4TK1-9971, TK7867-7867.5

The Physical Object

Format
[electronic resource] /
Pagination
1 online resource (xvii, 212 pages).
Number of pages
212

ID Numbers

Open Library
OL27043974M
Internet Archive
hotcarrierreliab00lebl
ISBN 10
1461364299, 1461532507
ISBN 13
9781461364290, 9781461532507
OCLC/WorldCat
851745862

Source records

Internet Archive item record
Better World Books record
Better World Books record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
February 27, 2022 Edited by ImportBot import existing book
October 10, 2020 Edited by ImportBot import existing book
August 3, 2020 Edited by ImportBot import existing book
July 1, 2019 Created by MARC Bot Imported from Internet Archive item record