Secondary Ion Mass Spectrometry SIMS IV

Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983

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Last edited by ImportBot
March 1, 2022 | History

Secondary Ion Mass Spectrometry SIMS IV

Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Language
English

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Previews available in: English

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Cover of: Secondary Ion Mass Spectrometry SIMS IV
Cover of: Secondary Ion Mass Spectrometry SIMS IV

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Book Details


Edition Notes

Online full text is restricted to subscribers.

Also available in print.

Mode of access: World Wide Web.

Published in
Berlin, Heidelberg
Series
Springer Series in Chemical Physics -- 36, Springer Series in Chemical Physics -- 36

Classifications

Dewey Decimal Class
541
Library of Congress
QD450-882, QD1-999, QD96.M3

The Physical Object

Format
[electronic resource] :
Pagination
v.

ID Numbers

Open Library
OL27086762M
Internet Archive
secondaryionmass1983sigm
ISBN 10
3642822584, 3642822568
ISBN 13
9783642822582, 9783642822568
OCLC/WorldCat
851373185

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
March 1, 2022 Edited by ImportBot import existing book
October 5, 2021 Edited by ImportBot import existing book
July 7, 2019 Created by MARC Bot Imported from Internet Archive item record