Anomalous X-Ray Scattering for Materials Characterization

Atomic-Scale Structure Determination

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Last edited by ImportBot
February 26, 2022 | History

Anomalous X-Ray Scattering for Materials Characterization

Atomic-Scale Structure Determination

The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.

Publish Date
Publisher
Springer
Pages
228

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Book Details


Edition Notes

Source title: Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Springer Tracts in Modern Physics (179))

Classifications

Library of Congress
TA418.7-418.76

The Physical Object

Format
paperback
Number of pages
228

ID Numbers

Open Library
OL28028304M
ISBN 10
3662146371
ISBN 13
9783662146378

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
February 26, 2022 Edited by ImportBot import existing book
May 11, 2020 Created by ImportBot Imported from amazon.com record