An edition of Journey to data quality (2006)

Journey to Data Quality

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Cover of: Journey to Data Quality by Yang W. Lee, Yang W. Lee, Leo L. Pipino, James D. Funk, Richard Y. Wang, Y. Lee
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Last edited by ImportBot
August 12, 2023 | History
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An edition of Journey to data quality (2006)

Journey to Data Quality

by

  • 1 Want to read
  • 1 Currently reading

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
MIT Press, The MIT Press
Language
English
Pages
240

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Previews available in: English

Subjects

Informatique, Management, Gestion, Business, Database management, Qualité, Qualität, Quality control, Contrôle, Data processing, Unternehmen, Datenstruktur, Bases de données, Business, data processing, Industrial management
Edition Availability
Cover of: Journey to Data Quality
Journey to Data Quality
2018, MIT Press
in English
Cover of: Journey to Data Quality
Journey to Data Quality
2009, MIT Press, The MIT Press
in English
Cover of: Journey to Data Quality
Journey to Data Quality
2009, MIT Press
in English
Cover of: Journey to Data Quality
Journey to Data Quality
2009, MIT Press
in English
Cover of: Journey to data quality
Journey to data quality
2006, MIT Press
in English
Cover of: Journey to Data Quality
Journey to Data Quality
2006, MIT Press
in English

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Book Details

Classifications

Library of Congress
HF5548.2.J68 2009

Edition Identifiers

Open Library
OL28448823M
Internet Archive
journeytodataqua0000unse_h9x4
ISBN 13
9780262513357

Work Identifiers

Work ID
OL17832861W

Source records

Better World Books record
Promise Item
Internet Archive item record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
August 12, 2023 Edited by ImportBot import existing book
May 4, 2023 Edited by ImportBot import existing book
August 2, 2020 Created by ImportBot Imported from Better World Books record