An edition of Interferometry XVI (2012)

Interferometry XVI

Techniques and Analysis

by , , and

Interferometry XVI
Joanna Schmit, Katherine Creat ...
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Last edited by ImportBot
August 3, 2020 | History
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An edition of Interferometry XVI (2012)

Interferometry XVI

Techniques and Analysis

by , , and

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Publish Date
Publisher
SPIE
Language
English
Pages
420

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Subjects

Interferometry, Measurement, Metrology
Edition Availability
Cover of: Interferometry XVI
Interferometry XVI: Techniques and Analysis
2012, SPIE
in English

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Book Details

Classifications

Library of Congress
TA1555.I5895 2012

ID Numbers

Open Library
OL28485915M
ISBN 13
9780819492104

Source records

Better World Books record

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August 3, 2020 Created by ImportBot Imported from Better World Books record