An edition of Advanced VLSI Design and Testability Issues (2020)

Advanced VLSI Design and Testability Issues

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Advanced VLSI Design and Testability Issues
Suman Lata Tripathi, Sobhit Sa ...
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Last edited by MARC Bot
December 16, 2022 | History
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An edition of Advanced VLSI Design and Testability Issues (2020)

Advanced VLSI Design and Testability Issues

by , , and

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Taylor & Francis Group
Language
English
Pages
362

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Subjects
Integrated circuits, Very large scale integration, Design and construction, TECHNOLOGY, Electricity, Electronics, Circuits, General

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Edition Availability
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2022, Taylor & Francis Group
in English
Libraries near you: WorldCat
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
Libraries near you: WorldCat
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Advanced Vlsi Design and Testability Issues
Advanced Vlsi Design and Testability Issues
2020, Taylor & Francis Group, CRC Press
in English
Libraries near you: WorldCat
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
Libraries near you: WorldCat
Cover of: Advanced VLSI Design and Testability Issues
Advanced VLSI Design and Testability Issues
2020, Taylor & Francis Group
in English
Libraries near you: WorldCat

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Book Details

Classifications

Library of Congress
, TK7874.75 .A38 2020

ID Numbers

Open Library
OL29508226M
ISBN 13
9781000168174
OCLC/WorldCat
1182513108

Source records

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marc_columbia MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
December 16, 2022 Edited by MARC Bot import existing book
August 26, 2020 Created by ImportBot Imported from Better World Books record