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Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
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Previews available in: English
Edition | Availability |
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1
Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and their Dynamics
Mar 12, 2014, Springer
paperback
3662145421 9783662145425
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2
Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and Their Dynamics
2013, Springer Berlin / Heidelberg
in English
366214543X 9783662145432
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3
Three-dimensional X-ray diffraction microscopy: mapping polycrystals and their dynamics
2004, Springer
in English
3540223304 9783540223306
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Includes bibliographical references and index.
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- Created April 1, 2008
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