Testing, reliability, and application of micro- and nano-material systems II

15-17 March, 2004, San Diego, California, USA

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

Buy this book

Last edited by MARC Bot
August 11, 2024 | History

Testing, reliability, and application of micro- and nano-material systems II

15-17 March, 2004, San Diego, California, USA

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
SPIE
Language
English
Pages
272

Buy this book

Previews available in: English

Book Details


Edition Notes

Includes bibliographical references and author index.

Published in
Bellingham, Wash
Series
SPIE proceedings series ;, v. 5392, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 5392.
Genre
Congresses.

Classifications

Dewey Decimal Class
621.36
Library of Congress
TA1750 .T472 2004, TA1750.T472 2004

The Physical Object

Pagination
viii, 272 p. :
Number of pages
272

ID Numbers

Open Library
OL3329379M
Internet Archive
testingreliabili0000unse_e2x1
ISBN 10
0819453099
LCCN
2004304501
OCLC/WorldCat
56094618
Goodreads
3565279

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
August 11, 2024 Edited by MARC Bot import existing book
June 22, 2023 Edited by ImportBot import existing book
December 8, 2020 Edited by MARC Bot import existing book
October 8, 2020 Edited by ImportBot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record