| Record ID | marc_records_scriblio_net/part15.dat:49611889:1503 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part15.dat:49611889:1503?format=raw |
LEADER: 01503cam 22003377a 4500
001 2004304501
003 DLC
005 20050915074353.0
008 041209s2004 waua b 101 0 eng d
010 $a 2004304501
020 $a0819453099
035 $a(OCoLC)ocm56094618
040 $aLHL$cLHL$dDLC
042 $alccopycat
050 00 $aTA1750$b.T472 2004
082 00 $a621.36$222
245 00 $aTesting, reliability, and application of micro- and nano-material systems II :$b15-17 March, 2004, San Diego, California, USA /$cNorbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash. :$bSPIE,$cc2004.
300 $aviii, 272 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series ;$vv. 5392
504 $aIncludes bibliographical references and author index.
650 0 $aElectrooptical devices$xMaterials$xTesting$vCongresses.
650 0 $aPhotonics$xMaterials$xTesting$vCongresses.
650 0 $aNanostructured materials$xTesting$vCongresses.
650 0 $aMicroelectromechanical systems$xTesting$vCongresses.
700 1 $aMeyendorf, Norbert.
700 1 $aBaaklini, George Y.
700 1 $aMichel, Bernd,$d1949-
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 5392.
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/fy054/2004304501.html