An edition of Atomic Force Microscopy-Based Electrical Characterization of Materials (2019)

Atomic Force Microscopy-Based Electrical Characterization of Materials

by

Atomic Force Microscopy-Based Electrical Char ...
Alba Avila, Alba Avila
Locate

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today
Notes
Notes

Check nearby libraries

Buy this book

Last edited by ImportBot
September 18, 2021 | History
Edit
An edition of Atomic Force Microscopy-Based Electrical Characterization of Materials (2019)

Atomic Force Microscopy-Based Electrical Characterization of Materials

by

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Taylor & Francis Group
Language
English
Pages
288

Check nearby libraries

Buy this book

Subjects

Scanning probe microscopy
Edition Availability
Cover of: Atomic Force Microscopy-Based Electrical Characterization of Materials
Atomic Force Microscopy-Based Electrical Characterization of Materials
2021, Taylor & Francis Group
in English
Cover of: Atomic Force Microscopy-Based Electrical Characterization of Materials
Atomic Force Microscopy-Based Electrical Characterization of Materials
2019, Taylor & Francis Group
in English

Add another edition?

Book Details

ID Numbers

Open Library
OL33505897M
ISBN 13
9781439883006

Source records

Better World Books record

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
September 18, 2021 Created by ImportBot Imported from Better World Books record