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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR and SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings
2008, Springer London, Limited
in English
3540896899 9783540896890
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- Created February 26, 2022
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February 26, 2022 | Created by ImportBot | Imported from Better World Books record |