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Subjects
Defects, Point defects, SemiconductorsEdition | Availability |
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1
Point Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-State Sciences)
June 1983, Springer
in English
0387115153 9780387115153
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Book Details
Table of Contents
1. Theoretical aspects
2. Experimental aspects.
Edition Notes
Includes bibliographical references and index.
Vol. 2 by J. Bourgoin, M. Lannoo, with a foreword by G.D. Watkins.
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The Physical Object
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History
- Created April 1, 2008
- 6 revisions
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December 9, 2022 | Edited by MARC Bot | import existing book |
December 4, 2022 | Edited by ImportBot | import existing book |
April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
December 14, 2009 | Edited by WorkBot | link works |
April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |