Semiconductor measurement technology

permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes

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Semiconductor measurement technology
James M. Kenney
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Last edited by MARC Bot
October 11, 2020 | History

Semiconductor measurement technology

permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Language
English
Pages
26

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Book Details


Edition Notes

Published in
Washington
Series
NBS special publication ; 400-7, NBS special publication ;, 400-7.

Classifications

Dewey Decimal Class
602/.1 s, 621.3815/22
Library of Congress
QC100 .U57 no. 400-7, TK7871.89 .U57 no. 400-7

The Physical Object

Pagination
26 p. :
Number of pages
26

ID Numbers

Open Library
OL4878215M
LCCN
76005868

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
October 11, 2020 Edited by MARC Bot import existing book
December 14, 2009 Edited by WorkBot link works
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record