An edition of Oxide reliability (2002)

Oxide Reliability

A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

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Oxide Reliability
D. J. Dumin, D. J. Dumin
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Last edited by ImportBot
August 17, 2023 | History
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An edition of Oxide reliability (2002)

Oxide Reliability

A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

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Publish Date
Publisher
World Scientific Publishing Co Pte Ltd
Language
English

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Previews available in: English

Subjects

Reliability, Metal oxide semiconductors, Silicon oxide, Deterioration, Oxides, Semiconductors
Edition Availability
Cover of: Oxide reliability
Oxide reliability: a summary of silicon oxide wearout, breakdown, and reliability
2002, World Scientific
in English
Cover of: Oxide Reliability
Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability
2002, World Scientific Publishing Co Pte Ltd
in English

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Book Details

Classifications

Library of Congress
TK7871.99.M44O95 200

The Physical Object

Pagination
280

ID Numbers

Open Library
OL49243470M
ISBN 13
9789812778062

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Better World Books record

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August 17, 2023 Created by ImportBot Imported from Better World Books record